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Ch. Straif, H. Hutter:
"Investigation of polymer thin films by use of Bi-cluster-ion-supported time of flight secondary ion mass spectrometry";
Analytical and Bioanalytical Chemistry, 393(8) (2009), S. 1889 - 1898.

Untersuchung der TOF-SIMS Massenspektren in Abhängigkeit der Primärionen-Cluster.

The investigation and analysis of polymer thin
films with Bin+, n=1-7 cluster ions has been demonstrated
by means of static secondary ion mass spectrometry
(SIMS). The highly specific signal enhancement of these
primary ions combined with the individual fragmentation
pattern of poly(4-vinylphenol) and poly(methyl methacrylate)
is the basic principle for a modified approach of data
reduction derived from the well-established g-SIMS procedure.
Based on mass spectra, which correspond to different
cluster ion sizes, not only a clear distinction between the
two polymers is feasible but also a further simplification of
the data can be demonstrated. It has been successfully proven
that characteristic polymer-relevant species can be refined
out of the large amount of unspecific and highly fragmented
secondary ions, which are usually present in SIMS spectra.
Therefore, a more precise and direct interpretation of complex
organic fragments becomes feasible, which consequently
enables the investigation of even more sophisticated samples.