Zeitschriftenartikel:
S. Rodewald, J. Fleig, J. Maier:
"Measurement of conductivity profiles in acceptor-doped strontium titanate";
Journal of the European Ceramic Society,
19
(1999),
S. 797
- 801.
Kurzfassung englisch:
Spatially resolved microcontact impedance spectroscopy using circular microelectrodes is applied to acceptor-doped SrTiO3. It is demonstrated that local bulk conductivities can be obtained with a spatial resolution down to the 10 μm range. In particular, conductivity profiles in electrocolored samples are measured, revealing a very characteristic profile shape. An existing model for the resistance degradation in SrTiO3 could be confirmed by this experiment. Measurements in polycrystalline material yield conductivity variations within single grains which can be related to oxygen vacancy blocking at grain boundaries and the corresponding stoichiometry variations.
"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/S0955-2219(98)00317-3