Yu. Illarionov, A. Smith, S. Vaziri, M. Ostling, T. Müller, M. Lemme, T. Grasser:
"Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors";
Applied Physics Letters, 105 (2014), 14; S. 1435071 - 1435075.
http://dx.doi.org/10.1063/1.4897344Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Illarionov_5.pdf