C. Ostermaier, P. Lagger, G. Prechtl, A. Grill, T. Grasser, D. Pogany:
"The role of electron transport in the charge trapping at the III-N/dielectric interface in AlGaN/GaN MIS-HEMT structures";
Vortrag: Semiconductor Interface Specialists Conference, Arlington, VA, USA; 02.12.2015 - 05.12.2015.