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V. S. Veeravalli, A. Steininger:
"Can we trust SET Injection Models?";
Talk: MEDIAN Finale Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Tallinn, Estonia; 2015-11-10 - 2015-11-11; in: "MEDIAN Finale Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale", (2015), 6 pages.

As the small structures on contemporary ASICs
become increasingly sensitive to radiation particle hits, it is
important to understand the related effects. Experimental studies
referring to this require high efforts, therefore analog-level
simulations have become the method of choice. While it is
comparatively easy to represent the actual circuit in a simulator
like SPICE at any desired level of detail - including parasitic
effects, e.g. - the representation of the particle hit is the crucial
problem. The state-of-the-art approach is to apply a current
pulse with double-exponential shape to a transistor by attaching
a current source across its channel terminals. In another, more
refined but less popular model two current sources are used, each
connected from bulk to one of the channel terminals. In this paper
we apply these two different models for the simulation of a Muller
C-element and try identify, how much difference the choice of the
model for the particle hit actually makes. Our results show that
even for this relatively simple target there are already remarkable
mismatches in the model predictions, which clearly confirms the
need for further research into SET simulation models.