M. Reiche, M. Kittler, E. Pippel, H. Uebensee, H. Kosina, A. Grill, Z. Stanojevic, O. Baumgartner:
"Impact of Defect-Induced Strain on Device Properties";
Advanced Engineering Materials, 18 (2016), 12; 1 - 4.
http://dx.doi.org/10.1002/adem.201600736Electronic version of the publication:
http://publik.tuwien.ac.at/files/publik_260163.pdf