[Zurück]

@article{TUW-106431,
    author = {Gehring, Andreas and Jimenez-Molinos, F. and Kosina, Hans and Palma, A. and Gamiz, Francisco and Selberherr, Siegfried},
    title = {Modeling of Retention Time Degradation Due to Inelastic Trap-Assisted Tunneling in EEPROM Devices},
    journal = {Microelectronics Reliability},
    year = {2003},
    volume = {43},
    number = {9-11},
    pages = {1495--1500},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2004/JB2003_Gehring_2.pdf},
    doi = {10.1016/S0026-2714(03)00265-8}
}



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