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@article{TUW-107765,
    author = {Ayalew, Tesfaye and Gehring, Andreas and Grasser, Tibor and Selberherr, Siegfried},
    title = {{E}nhancement of {B}reakdown {V}oltage for {N}i-{S}i{C} {S}chottky {D}iodes {U}tilizing {F}ield {P}late {E}dge {T}ermination},
    journal = {{M}icroelectronics {R}eliability},
    year = {2004},
    volume = {44},
    number = {9-11},
    pages = {1473--1478},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2005/JB2004_Ayalew_1.pdf},
    doi = {10.1016/j.microrel.2004.07.042}
}