[Zurück]

@inproceedings{TUW-108989,
    author = {Entner, Robert and Gehring, Andreas and Kosina, Hans and Grasser, Tibor and Selberherr, Siegfried},
    title = {Modeling of Tunneling Currents for Highly Degraded CMOS Devices},
    booktitle = {Proceedings of the 10th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)},
    year = {2005},
    pages = {219--222},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2006/CP2005_Entner_1.pdf},
    isbn = {4-9902762-0-5},
    doi = {10.1109/SISPAD.2005.201512},
    note = {Posterpr{\"a}sentation: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo, Japan; 2005-09-01 -- 2005-09-03}
}



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