@inproceedings{TUW-109001,
author = {Ungersb{\"o}ck, Stephan Enzo and Kosina, Hans},
title = {{T}he {E}ffect of {D}egeneracy on {E}lectron {T}ransport in {S}trained {S}ilicon {I}nversion {L}ayers},
booktitle = {{P}roceedings of the {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D})},
year = {2005},
pages = {311--314},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2006/CP2005_Ungersboeck_2.pdf},
isbn = {4-9902762-0-5},
doi = {10.1109/SISPAD.2005.201535},
note = {talk: {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D}), {T}okyo, {J}apan; 2005-09-01 -- 2005-09-03}
}
Created from the Publication Database of the Vienna University of Technology.