author = {Ungersb{\"o}ck, Stephan Enzo and Sverdlov, Viktor and Kosina, Hans and Selberherr, Siegfried},
    title = {Low-Field Electron Mobility in Stressed UTB SOI MOSFETs for Different Substrate Orientations},
    booktitle = {SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7},
    year = {2006},
    editor = {Harame, D. and Boquet, J. and Caymax, M. and Cressler, J. and Iwai, H. and Koester, S. and Masini, G. and Murota, J. and Reznicek, A. and Rim, K. and Tillack, B. and Zaima, S.},
    pages = {45--54},
    organization = {The Electrochemical Society},
    publisher = {ECS Transactions},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2007/JB2006_Ungersboeck_3.pdf},
    isbn = {1-56677-507-8},
    doi = {10.1149/1.2355793}

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.