[Zurück]

@article{TUW-110851,
    author = {Sverdlov, Viktor and Kosina, Hans and Selberherr, Siegfried},
    title = {Modeling Current Transport in Ultra-Scaled Field-Effect Transistors},
    journal = {Microelectronics Reliability},
    year = {2006},
    volume = {47},
    number = {1},
    pages = {11--19},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2007/JB2006_Sverdlov_1.pdf},
    doi = {10.1016/j.microrel.2006.03.009},
    note = {eingeladen}
}



Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.