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@article{TUW-110851,
    author = {Sverdlov, Viktor and Kosina, Hans and Selberherr, Siegfried},
    title = {{M}odeling {C}urrent {T}ransport in {U}ltra-{S}caled {F}ield-{E}ffect {T}ransistors},
    journal = {{M}icroelectronics {R}eliability},
    year = {2006},
    volume = {47},
    number = {1},
    pages = {11--19},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2007/JB2006_Sverdlov_1.pdf},
    doi = {10.1016/j.microrel.2006.03.009},
    note = {invited}
}