@inproceedings{TUW-112809,
author = {Ceric, Hajdin and Orio, Roberto and Selberherr, Siegfried},
title = {{C}omprehensive {M}odeling of {E}lectromigration {I}nduced {I}nterconnect {D}egradation {M}echanisms},
booktitle = {{P}roceedings of the {I}nternational {C}onference on {M}icroelectronics ({M}{I}{E}{L})},
year = {2008},
pages = {69--76},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2008/CP2008_Ceric_1.pdf},
isbn = {978-1-4244-1881-7},
doi = {10.1109/ICMEL.2008.4559225},
note = {invited; talk: {I}nternational {C}onference on {M}icroelectronics ({M}{I}{E}{L}), {N}is; 2008-05-11 -- 2008-05-14}
}
Created from the Publication Database of the Vienna University of Technology.