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@article{TUW-174601,
    author = {Ceric, Hajdin and Orio, Roberto and Cervenka, Johann and Selberherr, Siegfried},
    title = {{A} {C}omprehensive {T}{C}{A}{D} {A}pproach for {A}ssessing {E}lectromigration {R}eliability of {M}odern {I}nterconnects},
    journal = {{I}{E}{E}{E} {T}ransactions on {D}evice and {M}aterials {R}eliability},
    year = {2009},
    volume = {9},
    number = {1},
    pages = {9--19},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Ceric_1.pdf},
    doi = {10.1109/TDMR.2008.2000893}
}