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@inproceedings{TUW-182260,
    author = {Ceric, Hajdin and Orio, Roberto and Cervenka, Johann and Selberherr, Siegfried},
    title = {{T}he {E}ffect of {M}icrostructure on {E}lectromigration {I}nduced {V}oids},
    booktitle = {{P}roceedings of the {I}nternational {S}ymposium on the {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits ({I}{P}{F}{A})},
    year = {2009},
    pages = {694--697},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2009/CP2009_Ceric_3.pdf},
    isbn = {9781-4244-3912-6},
    note = {talk: {I}nternational {S}ymposium on the {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits ({I}{P}{F}{A}), {S}uzhou; 2009-07-06 -- 2009-07-10}
}



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