author = {Franco, J. and Kaczer, Ben and Mitard, J. and Eneman, G. and Roussel, Ph. J. and Crupi, F. and Grasser, Tibor and Witters, L. and Hoffmann, T.Y. and Groeseneken, G.},
    title = {{Implications of Channel Hot Carrier Degradation in Si{$_{0.45}$}Ge{$_{0.55}$} pMOSFETs}},
    year = {2010},
    note = {poster presentation: {S}emiconductor {I}nterface {S}pecialists {C}onference ({S}{I}{S}{C}), {S}an {D}iego; 2010-12-02 -- 2010-12-04}

Created from the Publication Database of the Vienna University of Technology.