[Zurück]

@article{TUW-197421,
    author = {Karner, Markus and Gehring, Andreas and Wagner, Martin and Entner, Robert and Holzer, Stefan and G{\"o}s, Wolfgang and Vasicek, Martin and Grasser, Tibor and Kosina, Hans and Selberherr, Siegfried},
    title = {VSP - A Gate Stack Analyzer},
    journal = {Microelectronics Reliability},
    year = {2007},
    volume = {47},
    number = {4-5},
    pages = {704--708},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2006/JB2007_Karner_1.pdf},
    doi = {10.1016/j.microrel.2007.01.059}
}



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