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@inproceedings{TUW-200264,
    author = {Orio, Roberto and Selberherr, Siegfried},
    title = {{C}ompact {M}odeling of {I}nterconnect {R}eliability},
    booktitle = {{P}roc. {I}{E}{E}{E} {C}onference on {E}lectron {D}evices and {S}olid-{S}tate {C}ircuits {E}{D}{S}{S}{C}},
    year = {2011},
    numpages = {2},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2011_Orio_2.pdf},
    isbn = {978-1-4577-1998-1},
    doi = {10.1109/EDSSC.2011.6117564},
    note = {invited; talk: {C}onference on {E}lectron {D}evices and {S}olid-{S}tate {C}ircuits ({E}{D}{S}{S}{C}), {T}ianjin, {C}hina; 2011-11-17 -- 2011-11-18}
}



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