[Zurück]

@inproceedings{TUW-208559,
    author = {Ceric, Hajdin and Orio, Roberto and Zisser, Wolfhard and Schnitzer, V. and Selberherr, Siegfried},
    title = {Modeling of Microstructural Effects on Electromigration Failure},
    booktitle = {Abstracts of 12th International Workshop on Stress-Induced Phenomena in Microelectronics},
    year = {2012},
    pages = {50--51},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2012_Ceric_1.pdf},
    note = {eingeladen; Vortrag: International Workshop on Stress-Induced Phenomena in Microelectronics, Kyoto, Japan; 2012-05-28 -- 2012-05-30}
}



Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.