@article{TUW-208625,
author = {Franco, J. and Kaczer, Ben and Toledano-Luque, M. and Bukhori, Muhammad Faiz and Roussel, Ph. J. and Grasser, Tibor and Asenov, A and Groeseneken, G.},
title = {{Impact of Individual Charged Gate-Oxide Defects on the Entire I{$_{D}$} -V{$_{G}$} Characteristic of Nanoscaled FETs}},
journal = {{I}{E}{E}{E} {E}lectron {D}evice {L}etters},
year = {2012},
volume = {33},
number = {6},
pages = {779--781},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2012_Grasser_1.pdf}
}
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