author = {Franco, J. and Kaczer, Ben and Toledano-Luque, M. and Bukhori, Muhammad Faiz and Roussel, Ph. J. and Grasser, Tibor and Asenov, A and Groeseneken, G.},
    title = {{Impact of Individual Charged Gate-Oxide Defects on the Entire I{$_{D}$} -V{$_{G}$} Characteristic of Nanoscaled FETs}},
    journal = {{I}{E}{E}{E} {E}lectron {D}evice {L}etters},
    year = {2012},
    volume = {33},
    number = {6},
    pages = {779--781},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2012_Grasser_1.pdf}

Created from the Publication Database of the Vienna University of Technology.