[Zurück]

@inproceedings{TUW-208760,
    author = {Ceric, Hajdin and Orio, Roberto and Zisser, Wolfhard and Selberherr, Siegfried},
    title = {Ab Initio Method for Electromigration Analysis},
    booktitle = {Proceedings of the 19th IEEE International Symposium on the Physical {\&} Failure Analysis of Integrated Circuits},
    year = {2012},
    numpages = {4},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/CP2012_Ceric_1.pdf},
    isbn = {978-1-4673-0982-0},
    doi = {10.1109/IPFA.2012.6306306},
    note = {Vortrag: IEEE Electronics Packaging Technology Conference (EPTC), Singapore; 2012-07-02 -- 2012-07-06}
}



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