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@inproceedings{TUW-209876,
    author = {Orio, Roberto and Ceric, Hajdin and Selberherr, Siegfried},
    title = {{A}nalysis of {R}esistance {C}hange {D}evelopment due to {V}oiding in {C}opper {I}nterconnects ended by a {T}hrough {S}ilicon {V}ia},
    booktitle = {{E}{C}{S} {T}ransactions},
    year = {2012},
    pages = {273--280},
    publisher = {49},
    address = {1},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/CP2012_Orio_2.pdf},
    isbn = {978-1-56677-990-6},
    doi = {10.1149/04901.0273ecst},
    note = {talk: {I}nternational {S}ymposium on {M}icroelectronics {T}echnology and {D}evices ({S}{B}{M}icro), {B}rasilia, {B}razil; 2012-08-30 -- 2012-09-02}
}



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