[Back]

@inproceedings{TUW-210450,
    author = {Orio, Roberto and Ceric, Hajdin and Selberherr, Siegfried},
    title = {{E}lectromigration {F}ailure in a {C}opper {D}ual-{D}amascene {S}tructure with a {T}hrough {S}ilicon {V}ia},
    booktitle = {{P}roceedings of the 23rd {E}uropean {S}ymposium on the {R}eliability of {E}lectron {D}evices, {F}ailure {P}hysics and {A}nalysis},
    year = {2012},
    pages = {1981--1986},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/CP2012_Orio_3.pdf},
    note = {poster presentation: 23rd {E}uropean {S}ymposium on the {R}eliability of {E}lectron {D}evices, {F}ailure {P}hysics and {A}nalysis, {C}agliari, {I}taly; 2012-10-01 -- 2012-10-05}
}