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@article{TUW-218601,
    author = {Starkov, Ivan and Enichlmair, H.},
    title = {{L}ocal oxide capacitance as a crucial parameter for characterization of hot-carrier degradation in long-channel n-{M}{O}{S}{F}{E}{T}s},
    journal = {{J}ournal of {V}acuum {S}cience {\&} {T}echnology {B}},
    year = {2013},
    volume = {31},
    number = {1},
    pages = {01A118-1--01A118-7},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2013_Starkov_4.pdf},
    doi = {10.1116/1.4774106}
}



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