author = {Kaczer, Ben and Afanas'Ev, V. V. and Rott, K. and Cerbu, F. and Franco, J. and G{\"o}s, Wolfgang and Grasser, Tibor and Madia, O. and Nguyen, D.P. and Stesmans, A. and Reisinger, H. and Toledano-Luque, M. and Weckx, P.},
    title = {{E}xperimental characterization of {B}{T}{I} defects},
    booktitle = {{P}roceedings of the {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D})},
    year = {2013},
    pages = {444--450},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Goes_2.pdf},
    isbn = {978-1-4673-5733-3},
    doi = {10.1109/SISPAD.2013.6650670},
    note = {invited; talk: {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D}), {G}lasgow, {S}cotland, {U}nited {K}ingdom; 2013-09-03 -- 2013-09-05}

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