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@inproceedings{TUW-219766,
    author = {Ceric, Hajdin and Orio, Roberto and Selberherr, Siegfried},
    title = {{A}nalysis of {S}older {B}ump {E}lectromigration {R}eliability},
    booktitle = {{P}roceedings of the 20th {I}nternational {S}ymposium on the {P}hysical {\&} {F}ailure {A}nalysis of {I}ntegrated {C}ircuits},
    year = {2013},
    pages = {713--716},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Ceric_2.pdf},
    isbn = {978-1-4799-0478-5},
    doi = {10.1109/IPFA.2013.6599258},
    note = {poster presentation: {I}nternational {S}ymposium on the {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits ({I}{P}{F}{A}), {S}uzhou, {C}hina; 2013-07-15 -- 2013-07-19}
}



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