@article{TUW-228384,
author = {Franco, J. and Kaczer, Ben and Mitard, J. and Toledano-Luque, M. and Roussel, Ph. J. and Witters, L. and Grasser, Tibor and Groeseneken, Guido},
title = {{N}{B}{T}{I} {R}eliability of {S}i{G}e and {G}e {C}hannel p{M}{O}{S}{F}{E}{T}s {W}ith {S}i{O}2/{H}f{O}2 {D}ielectric {S}tack},
journal = {{I}{E}{E}{E} {T}ransactions on {D}evice and {M}aterials {R}eliability},
year = {2013},
volume = {13},
number = {4},
pages = {497--506},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/JB2014_Grasser_2.pdf},
doi = {10.1109/TDMR.2013.2281731},
note = {invited}
}
Created from the Publication Database of the Vienna University of Technology.