@inproceedings{TUW-228650,
author = {G{\"o}s, Wolfgang and Toledano-Luque, M. and Schanovsky, Franz and Bina, Markus and Baumgartner, Oskar and Kaczer, Ben and Grasser, Tibor},
title = {{M}ulti-{P}honon {P}rocesses as the {O}rigin of {R}eliability {I}ssues},
booktitle = {{E}{C}{S} {T}ransactions 2013 - ''{S}emiconductors, {D}ielectrics, and {M}aterials for {N}anoelectronics 11''},
year = {2013},
pages = {31--47},
address = {58/7/},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Goes_3.pdf},
doi = {10.1149/05807.0031ecst},
note = {invited; talk: {M}eeting of the {E}lectrochemical {S}ociety ({E}{C}{S}), {S}an {F}rancisco, {U}{S}{A}; 2013-10-27 -- 2013-11-01}
}
Created from the Publication Database of the Vienna University of Technology.