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@inproceedings{TUW-228694,
    author = {Franco, J. and Kaczer, Ben and Roussel, Philippe J. and Toledano-Luque, M. and Weckx, P. and Grasser, Tibor},
    title = {{R}elevance of non-exponential single-defect-induced threshold voltage shifts for {N}{B}{T}{I} {V}ariability},
    booktitle = {2013 {I}{E}{E}{E} {I}nternational {I}ntegrated {R}eliability {W}orkshop {F}inal {R}eport},
    year = {2013},
    pages = {69--72},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Grasser_4.pdf},
    isbn = {978-1-4799-0350-4},
    note = {talk: {I}{E}{E}{E} {I}nternational {R}eliability {W}orkshop ({I}{I}{R}{W}), {S}outh {L}ake {T}ahoe, {U}{S}{A}; 2013-10-13 -- 2013-10-17}
}



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