[Zurück]

@inproceedings{TUW-228701,
    author = {Zisser, Wolfhard and Ceric, Hajdin and Orio, Roberto and Selberherr, Siegfried},
    title = {Electromigration Induced Stress in Open TSVs},
    booktitle = {2013 IEEE International Integrated Reliability Workshop Final Report},
    year = {2013},
    pages = {142--145},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Zisser_2.pdf},
    isbn = {978-1-4799-0350-4},
    doi = {10.1109/IIRW.2013.6804179},
    note = {Vortrag: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 2013-10-13 -- 2013-10-17}
}



Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.