@inproceedings{TUW-228701,
author = {Zisser, Wolfhard and Ceric, Hajdin and Orio, Roberto and Selberherr, Siegfried},
title = {{E}lectromigration {I}nduced {S}tress in {O}pen {T}{S}{V}s},
booktitle = {{F}inal {R}eport of the {I}{E}{E}{E} {I}nternational {I}ntegrated {R}eliability {W}orkshop ({I}{I}{R}{W})},
year = {2013},
pages = {142--145},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Zisser_2.pdf},
isbn = {978-1-4799-0350-4},
doi = {10.1109/IIRW.2013.6804179},
note = {talk: {I}{E}{E}{E} {I}nternational {R}eliability {W}orkshop ({I}{I}{R}{W}), {S}outh {L}ake {T}ahoe, {U}{S}{A}; 2013-10-13 -- 2013-10-17}
}
Created from the Publication Database of the Vienna University of Technology.