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@inproceedings{TUW-230036,
    author = {Zisser, Wolfhard and Ceric, Hajdin and Weinbub, Josef and Selberherr, Siegfried},
    title = {{E}lectromigration {R}eliability of {O}pen {T}{S}{V} {S}tructures},
    booktitle = {{P}roceedings of the 21st {I}nternational {S}ymposium on the {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits},
    year = {2014},
    pages = {317--320},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2014_Zisser_3.pdf},
    isbn = {978-1-4799-3931-2},
    doi = {10.1109/IPFA.2014.6898179},
    note = {talk: {I}{E}{E}{E} {I}nternational {S}ymposium on the {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits ({I}{P}{F}{A}), {S}ingapore, {S}ingapore; 2014-06-30 -- 2014-07-04}
}