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@inproceedings{TUW-230039,
    author = {Rott, Gunnar Andreas and Nielen, H. and Reisinger, H. and Gustin, W. and Tyaginov, S. E. and Grasser, Tibor},
    title = {{D}rift {C}ompensating {E}ffect during {H}ot-{C}arrier {D}egradation of 130nm {D}ual {G}ate {O}xide p-channel {T}ransistors},
    booktitle = {2013 {I}{E}{E}{E} {I}nternational {I}ntegrated {R}eliability {W}orkshop {F}inal {R}eport},
    year = {2013},
    pages = {73--77},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Tyaginov_2.pdf},
    isbn = {978-1-4799-0350-4},
    note = {talk: {I}{E}{E}{E} {I}nternational {R}eliability {W}orkshop ({I}{I}{R}{W}), {S}outh {L}ake {T}ahoe, {U}{S}{A}; 2013-10-13 -- 2013-10-17}
}



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