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@inproceedings{TUW-231508,
    author = {Zisser, Wolfhard and Ceric, Hajdin and Weinbub, Josef and Selberherr, Siegfried},
    title = {{E}lectromigration {I}nduced {R}esistance {I}ncrease in {O}pen {T}{S}{V}s},
    booktitle = {{P}roceedings of the 19th {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D})},
    year = {2014},
    pages = {249--252},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Zisser_1.pdf},
    isbn = {978-1-4799-5285-4},
    doi = {10.1109/SISPAD.2014.6931610},
    note = {poster presentation: {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D}), {Y}okohama, {J}apan; 2014-09-09 -- 2014-09-11}
}



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