[Zurück]

@inproceedings{TUW-231524,
    author = {Zisser, Wolfhard and Ceric, Hajdin and Weinbub, Josef and Selberherr, Siegfried},
    title = {Electromigration Reliability of Open TSV Structures},
    booktitle = {Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)},
    year = {2014},
    pages = {48},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Zisser_2.pdf},
    note = {Posterpr{\"a}sentation: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis  (ESREF), Berlin, Germany; 2014-09-29 -- 2014-10-02}
}



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