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@article{TUW-235959,
    author = {Rott, Gunnar Andreas and Rott, K. and Reisinger, H. and Gustin, W. and Grasser, Tibor},
    title = {{M}ixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors},
    journal = {{M}icroelectronics {R}eliability},
    year = {2014},
    volume = {54},
    number = {9-10},
    pages = {2310--2314},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Grasser_3.pdf},
    doi = {10.1016/j.microrel.2014.07.040}
}



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