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@article{TUW-235961,
    author = {Camargo, V. V. A. and Kaczer, Ben and Grasser, Tibor and Wirth, G.},
    title = {{C}ircuit simulation of workload-dependent {R}{T}{N} and {B}{T}{I} based on trap kinetics},
    journal = {{M}icroelectronics {R}eliability},
    year = {2014},
    volume = {54},
    number = {11},
    pages = {2364--2370},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Grasser_5.pdf}
}



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