[Back]

@inproceedings{TUW-238782,
    author = {Illarionov, Yury and Waltl, Michael and Smith, A.D. and Vaziri, S. and Ostling, M. and Lemme, M.C. and Grasser, Tibor},
    title = {{I}mpact of {H}ot {C}arrier {S}tress on the {D}efect {D}ensity and {M}obility in {D}ouble-{G}ated {G}raphene {F}ield-{E}ffect {T}ransistors},
    booktitle = {{P}roceedings of 2015 {J}oint {I}nternational {E}{U}{R}{O}{S}{O}{I} {W}orkshop and {I}nternational {C}onference on {U}ltimate {I}ntegration on {S}ilicon},
    year = {2015},
    pages = {81--84},
    publisher = {{I}eee {X}plore},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2015_Illarionov_1.pdf},
    isbn = {978-1-4799-6910-4},
    doi = {10.1109/ULIS.2015.7063778},
    note = {talk: {J}oint {I}nternational {E}{U}{R}{O}{S}{O}{I} {W}orkshop and {I}nternational {C}onference on {U}ltimate {I}ntegration on {S}ilicon ({E}{U}{R}{O}{S}{O}{I}-{U}{L}{I}{S}), {B}ologna, {I}taly; 2015-01-26 -- 2015-01-28}
}



Created from the Publication Database of the Vienna University of Technology.