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@inproceedings{TUW-238800,
    author = {Rovitto, Marco and Zisser, Wolfhard and Ceric, Hajdin and Grasser, Tibor},
    title = {{E}lectromigration {M}odelling of {V}oid {N}ucleation in {O}pen {C}u-{T}{S}{V}s},
    booktitle = {{P}roceedings of the {I}{E}{E}{E} 16th {I}nternational {C}onference on {T}hermal, {M}echanical {\&} {M}ulti-{P}hysics {S}imulation and {E}xperiments in {M}icroelectronics and {M}icrosystems ({E}uro{S}im{E})},
    year = {2015},
    publisher = {{I}{E}{E}{E} {X}plore},
    numpages = {5},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2015_Rovitto_1.pdf},
    isbn = {978-1-4799-9949-1},
    doi = {10.1109/EuroSimE.2015.7103100},
    note = {poster presentation: {I}nternational {C}onference on {T}hermal, {M}echanical and {M}ulti-{P}hysics {S}imulation and {E}xperiments in {M}icroelectronics and {M}icrosystems ({E}uro{S}im{E}), {B}udapest, {H}ungary; 2015-04-19 -- 2015-04-22}
}



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