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@inproceedings{TUW-239282,
    author = {Tyaginov, S. E. and Bina, Markus and Franco, J. and Wimmer, Yannick and Rudolf, Florian and Enichlmair, H. and Park, J.M. and Kaczer, Ben and Ceric, Hajdin and Grasser, Tibor},
    title = {{D}ominant {M}echanism of {H}ot-{C}arrier {D}egradation in {S}hort- and {L}ong-{C}hannel {T}ransistors},
    booktitle = {{F}inal {R}eport of the {I}{E}{E}{E} {I}nternational {I}ntegrated {R}eliability {W}orkshop ({I}{I}{R}{W})},
    year = {2014},
    pages = {63--68},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Tyaginov_3.pdf},
    isbn = {978-1-4799-7308-8},
    doi = {10.1109/IIRW.2014.7049512},
    note = {talk: {I}{E}{E}{E} {I}nternational {R}eliability {W}orkshop ({I}{I}{R}{W}), {S}outh {L}ake {T}ahoe, {C}{A}, {U}{S}{A}; 2014-10-12 -- 2014-10-16}
}



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