author = {Sharma, Prateek and Tyaginov, S. E. and Wimmer, Yannick and Rudolf, Florian and Rupp, Karl and Bina, Markus and Enichlmair, H. and Park, J.M. and Minixhofer, R. and Ceric, Hajdin and Grasser, Tibor},
    title = {Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation},
    journal = {IEEE Transactions on Electron Devices},
    year = {2015},
    volume = {62},
    number = {6},
    pages = {1811--1818},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2015_Sharma_1.pdf},
    doi = {10.1109/TED.2015.2421282}

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