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@inproceedings{TUW-239620,
    author = {Illarionov, Yury and Waltl, Michael and Smith, A.D. and Vaziri, S. and Ostling, M. and M{\"u}ller, Thomas and Lemme, M.C. and Grasser, Tibor},
    title = {{H}ot-{C}arrier {D}egradation in {S}ingle-{L}ayer {D}ouble-{G}ated {G}raphene {F}ield-{E}ffect {T}ransistors},
    booktitle = {{P}roceedings of the 2015 {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S})},
    year = {2015},
    pages = {XT.2.1--XT.2.6},
    publisher = {{I}{E}{E}{E}},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2015_Illarionov_2.pdf},
    doi = {10.1109/IRPS.2015.7112834},
    note = {talk: {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S}), {M}onterey, {C}{A}, {U}{S}{A}; 2015-04-19 -- 2015-04-23}
}



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