author = {Sharma, Prateek and Tyaginov, S. E. and Wimmer, Yannick and Rudolf, Florian and Rupp, Karl and Enichlmair, H. and Park, J.M. and Ceric, Hajdin and Grasser, Tibor},
    title = {Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs},
    journal = {Microelectronics Reliability},
    year = {2015},
    volume = {55},
    number = {9-10},
    pages = {1427--1432},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2015/JB2015_sharma_1.pdf},
    doi = {10.1016/j.microrel.2015.06.021}

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