[Zurück]

@article{TUW-242899,
    author = {Sharma, Prateek and Tyaginov, S. E. and Jech, Markus and Wimmer, Yannick and Rudolf, Florian and Enichlmair, H. and Park, J.M. and Ceric, Hajdin and Grasser, Tibor},
    title = {The Role of Cold Carriers and the Multiple-Carrier Process of Si-H Bond Dissociation for Hot-Carrier Degradation in n- and p-channel LDMOS Devices},
    journal = {Solid-State Electronics},
    year = {2016},
    volume = {115},
    number = {Part B},
    pages = {185--191},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2015/JB2015_sharma_2.pdf},
    doi = {10.1016/j.sse.2015.08.014}
}



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