[Zurück]

@inproceedings{TUW-243611,
    author = {Sharma, Prateek and Tyaginov, S. E. and Wimmer, Yannick and Rudolf, Florian and Rupp, Karl and Enichlmair, H. and Park, J.M. and Ceric, Hajdin and Grasser, Tibor},
    title = {Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs},
    booktitle = {Abstracts of the 26\textsuperscript{th} European Symposium on Reliability of Electron Devices, Failure Physics and Analysis},
    year = {2015},
    pages = {60},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2015/CP2015_Sharma_2.pdf},
    note = {Vortrag: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis  (ESREF), Toulouse, France; 2015-10-05 -- 2015-10-09}
}



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