[Zurück]

@article{TUW-248528,
    author = {Tyaginov, S. E. and Jech, Markus and Franco, J. and Sharma, Prateek and Kaczer, Ben and Grasser, Tibor},
    title = {Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON n-MOSFETs},
    journal = {IEEE Electron Device Letters},
    year = {2016},
    volume = {37},
    number = {1},
    pages = {84--87},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_tyaginov_1.pdf},
    doi = {10.1109/LED.2015.2503920}
}



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