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@inproceedings{TUW-249852,
    author = {Illarionov, Yury and Waltl, Michael and Furchi, Marco Mercurio and M{\"u}ller, Thomas and Grasser, Tibor},
    title = {{R}eliability of {S}ingle-{L}ayer {M}o{S}2 {F}ield-{E}ffect {T}ransistors with {S}i{O}2 and h{B}{N} {G}ate {I}nsulators},
    booktitle = {{P}roceedings of the 2016 {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S})},
    year = {2016},
    pages = {5A-1-1--5A-1-6},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2016/CP2016_Illarionov_1.pdf},
    doi = {10.1109/IRPS.2016.7574543},
    note = {talk: {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S}), {P}asadena, {C}{A}, {U}{S}{A}; 2016-04-17 -- 2016-04-21}
}



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