[Zurück]

@inproceedings{TUW-249870,
    author = {Tyaginov, S. E. and Jech, Markus and Sharma, Prateek and Franco, J. and Kaczer, Ben and Grasser, Tibor},
    title = {On the Temperature Behavior of Hot-Carrier Degradation},
    booktitle = {2015 IEEE International Integrated Reliability Workshop Final Report (IIRW)},
    year = {2015},
    pages = {143--146},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2016/CP_2016_Tyaginov_1.pdf},
    doi = {10.1109/IIRW.2015.7437088},
    note = {Vortrag: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 2015-10-11 -- 2015-10-15}
}



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