author = {Illarionov, Yury and Rzepa, Gerhard and Waltl, Michael and Knobloch, Theresia and Grill, Alexander and Furchi, Marco Mercurio and M{\"u}ller, Thomas and Grasser, Tibor},
    title = {{The Role of Charge Trapping in MoS{$_{2}$}/SiO{$_{2}$} and MoS{$_{2}$}/hBN Field-Effect Transistors}},
    journal = {2{D} {M}aterials},
    year = {2016},
    volume = {3},
    number = {3},
    pages = {035004-1--035004-10},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_Illarionov_2.pdf},
    doi = {10.1088/2053-1583/3/3/035004}

Created from the Publication Database of the Vienna University of Technology.